JewelBox Oversize X-ray Cabinet

JewelBox Oversize, Real-time, High Resolution X-ray Inspection System with Crystal-X Imaging for up to 2000x Magnification

The JewelBox Oversize delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system’s patented XRTV X-ray camera and Crystal-X imaging plus a 10-micron MicroTech™ x-ray source provide magnification from 7X to 2000X, with resolution of 100 line pairs/mm.

The ability to manipulate the subject with the five-axis positioner and simultaneously view it from any angle allows the operator to produce accurate images quickly during failure analysis.

All JewelBox inspection systems come with the pre-installed GTI-5000 Imaging Software. The extensive features of the GTI Software includes Auto-BGA and void measurement make the JewelBox Oversize an ideal laboratory instrument to inspect electronic components and more.

Specifications:

• Operating voltage: 120v/220v/50-60 hz
• Anode voltage: 80 kV standard. Optional: 90kV, 100kV, 110 kV.
• Anode current: 100 microamps (adjustable)
• Magnification: variable from 7X to 2000X
• Focal spot size: 10 micron – 5 micron
• Focal spot to image plane distance: 13 7/16″ (341.3mm) (factory preset)
• Nominal exterior dimensions: 52 1/2″W x 42 1/2″D x 74″H
• Inspection compartment dimensions: 48 1/2″W x 30″ D x 23 3/4″H
• Manipulator: five-axis joystick positioner
• Image Processing: GTI Imaging Software pre-loaded on PC computer with monitor, keyboard and mouse
• Computer console

Options:

• Image Processors
• Laptop
• Dual Camera

Applications:

• Multilayer and assembled pc boards including BGA, QFN, LED and other device
• Component Authenticity Inspection
• Connectors, Cables and Sensors
• IC Packaging and Wire Bonds
• Battery Inspection
• Medical Electronics including hearing aids and pacemakers