Real-time X-ray Inspection System

The JewelBox-70T delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system's high-resolution x-ray camera and 10-micron MicroTech™ x-ray source provide magnification from 7X to 2000X, with resolution of 100 line pairs/mm.

Glenbrook's unique x-ray camera technology captures x-ray images with relatively low kV x-ray emission. The ability to manipulate the subject with the five-axis positioner and simultaneously view it from any angle allows the operator to produce accurate images quickly during failure analysis.


In the video below, Radwell International shows how they use The Jewelbox-70T for x-ray inspection of BGAs, counterfeit chips, and more.


All JewelBox inspection systems come with the pre-installed GTI-5000 Image Processing Workstation. The extensive features of the GTI-5000, including Auto-BGA and void measurement, make the JewelBox-70T an ideal laboratory instrument to inspect electronic components. For customers who don't need the advanced capabilities of the GTI-5000, the economical GTI-1000 is available as an option.

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  • Operating voltage: 120v/220v/50-60 hz
  • Anode voltage: 80 kV (adjustable)
  • Anode current: 100 microamps (adjustable)
  • Magnification: variable from 7X to 2000X
  • Focal spot size: 10 micron
  • Focal spot to image plane distance: 13 7/16" (341.3mm) (factory preset)
  • Nominal exterior dimensions: 35 1/8"W x 43 1/8"D x 64 1/4"H (892.175mm L x 1095.375mm W x 1631.95mm H)
  • Inspection compartment dimensions: 28 1/2"W x 30" D x 23 3/4"H (723.9mm L x 1095.375mm W x 1631.95mm H)
  • Manipulator: five-axis joystick positioner
  • Image Processing: GTI-5000 image processing workstation pre-loaded on PC computer with monitor, keyboard and mouse
  • Computer console
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